Equipment

Scanning probe microscope with a resolution of up to approximately 100 nm in X-Y and 10 nm in Z, allowing it to operate under micrometric conditions or with samples at larger size scales. The equipment features semi-contact scanning mode. Due to its resolution characteristics, it is ideal for the analysis of biological samples (cells, bacteria, etc.), as well as organic and inorganic samples.

Scanning probe equipment capable of achieving nanometric resolutions. It can acquire topographic images in contact, semi-contact, and non-contact modes (ideal for multistep techniques). It also allows magnetic (MFM), electrical (EFM), Kelvin Probe Microscopy (KPM), and Lateral Force Microscopy (LFM) measurements.